Impact of device level faults in a digital avionic processor

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Coordinated Science Laboratory, College of Engineering, University of Illinois at Urbana-Champaign , Urbana, Ill
Flight con
StatementSuk Ho Kim.
SeriesNASA-CR -- 184783., NASA contractor report -- NASA CR-184783.
ContributionsUnited States. National Aeronautics and Space Administration.
The Physical Object
Pagination1 v.
ID Numbers
Open LibraryOL15280380M

Get this from a library. Impact of device level faults in a digital avionic processor. [Suk Ho Kim; United States. National Aeronautics and Space Administration.].

Impact of Device Level Faults in a Digital Avionic Processor. By Suk Ho Kim. Topics: Fault injection, Fault propagation, Device level fault, Device-level fault Author: Suk Ho Kim. Impact of device level faults in a digital avionic processor. Impact of device level faults in a digital avionic processor book This paper describes an experimental analysis of the impact of gate and device-level faults in the processor of a flight control system.

Via mixed mode simulation faults were injected both at the gate (stuck-at) and at the transistor levels, and their propagation through the Author: R. Iyer and S. Kim. and R.K. Iyer, “Impact of Device Level Faults in a Digital Avionic Processor”, AIAA/IEEE 8th Digital Avionics Systems Conference, pp.

–, Oct. Google Scholar [13]Cited by: The book examines such topics as modeling and simulation, electronic hardware reliability, certification, fault tolerance, and several examples of real-world applications. New chapters discuss RTCA DO/EUROCAE ED integrated modular avionics development and the Genesis platform.

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_Cfm Page vii Wednesday, November 8, AM. Richard Sheng, in Systems Engineering for Aerospace, Avionics Compartment. The Avionics Compartment, located just below the Flight Compartment, comprises several different racks. The largest and most important rack housed here is the Main Avionics Rack, or MAR for the most part, equipment is installed in this rack for close proximity to controllers in the Flight.

Avionics. The Preliminary section does not discuss avionic systems; it is there to assist the reader on general aerospace facts that could be useful once the avionic section is reached. The 20 acronyms listed above would be explained in the Avionics section, which in principle forms the essence of this book.

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Classes of equipment are discussed in general and then the operation of specific pieces from. the processor level. designs in terms of their suitability for use in avionics applications, due to the impact of architectural design features on standard Digital Avionics Handbook. American Institute of Aeronautics and Astronautics Sunrise Valley Drive, Suite Reston, VA Avionics Technology: Diagnostic Tools for the Next Generation Some of the most common include an amp clamp for sensing current flow and a thermal sensor which can turn a testing device into a.

The PIC incorporates both a Peripheral Interface Controller and a ten bit analogue to digital converter. The PIC being an embedded program driven device is programmed in C language. design concerns. The third part looks at general dependability issues in avionics, from both the computer engineering and the human-computer interaction perspectives.

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Although we edited the book, most of the material was written by students in a graduate seminar on digital avionics. This paper discusses the problems of pin-level fault injection for dependability validation and presents the architecture of a pin-level fault injector called RIFLE.

This system can be adapted to a wide range of target systems and the faults are mainly injected in the processor pins. Charles J. Fraser, in Mechanical Engineer's Reference Book (Twelfth Edition), Digital computers and microprocessors. No coverage of digital electronics, however brief, can fail to give some cognizance to the impact of the digital computer andem, co its associated microprocessor.

The modern digital computer, although a complex. Although anticipated commercial avionics applications can be accommodated with a state-of-the-art single processor system, the fault tolerance required by flight-crucial systems adds substantial overhead that significantly reduces the effective throughput of avionics computers.

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The function of a digital input module is to determine the ON/OFF status of a signal or signals in the external world and communicate that information to the PLC processor.

Most digital input modules detect changes in voltage levels, and they are available with various AC, DC, or universal ratings, with universal modules typically accepting a.

Details Impact of device level faults in a digital avionic processor PDF

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Ten brand-new chapters covering new topics and emerging trends. FMEA/FMECA and the fault hazard analysis is a matter of depth. Wherein the FMEA or FMECA looks at all failures and their effects, the fault hazard analysis is charged only with consideration of those effects that are safety related.

The Fault Hazard Analysis of a subsy stem is an engineering analysis that answers a series of questions. Impact of device level faults in a digital avionic processor [microform] [] Kim, Suk Ho. Urbana, Ill.: Coordinated Science Laboratory, College of Engineering, University of.

Digital computer, any of a class of devices capable of solving problems by processing information in discrete operates on data, including magnitudes, letters, and symbols, that are expressed in binary code—i.e., using only the two digits 0 and 1. By counting, comparing, and manipulating these digits or their combinations according to a set of instructions held in its memory, a.

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You will see how electronic flight instrument systems integrate many individual instruments into a single presentation called a primary flight display (PFD). Since all flight instruments are combined in one integrated electronic flight instrument system, a number.

The first is busy waiting or polling, where the processor continuously checks the device’s status register until the device is ready. This wastes the processor’s time but is the simplest to implement. For some time-critical applications, polling can reduce the time it takes for the processor to respond to a change of state in a peripheral.

The device 1 can comprise an arbitrary number of sub-assemblies. The outputs 5 of the device 1 are linked in an appropriate manner to a processor 6, which dispatches control signals 7 to it. Furthermore, the processor 6 dispatches control signals 8 to the multiplexer 2 and.

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Description Impact of device level faults in a digital avionic processor FB2

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Digital Signal Processors (DSP) take real-world signals like voice, audio, video, temperature, pressure, or position that have been digitized and then mathematically manipulate them.

A DSP is designed for performing mathematical functions like "add", "subtract", "multiply" and "divide" very quickly.This book provides the reader with knowledge on a wide variety of radiation fields and their effects on the electronic devices and systems.

The author covers faults and failures in ULSI devices induced by a wide variety of radiation fields, including electrons, alpha-rays, muons, gamma rays, neutrons and heavy ions.

Readers will learn how to make numerical models from physical insights, increasing the level of the first transmitted symbol. The subsequent symbol levels are untouched if they were transmitted at the same level.

For example, if a signal transmits a high level for three symbols, only the first symbol is boosted. The next two symbols are transmitted at the usual level. Figure 4 illustrates pre-emphasis. If a.